ISIS Neutron and Muon Source Data Journal

Establishing the limitations of photoexcited muon spin spectroscopy

Abstract: Crystalline silicon is used for >90% of photovoltaic solar cells. Electron-hole pairs are produced when light of certain frequencies is absorbed. Some of these charge carriers are lost due to recombination processes in the silicon before they are collected, and the lifetime (or diffusion length) of the carriers defines the quality of a silicon wafer. Photoexcited muon spin spectroscopy (photo-µSR), developed at ISIS, is a means to measure depth-dependent excess charge carrier density ? distinguishing surface- and bulk- recombination of charge carriers. Our objective is to further develop the photo-µSR approach by (i) defining the range and upper limits of surface recombination velocities distinguishable and (ii) expanding its capability to collect injection-dependent carrier lifetimes.

Principal Investigator: Dr Sophie Pain
Local Contact: Dr Koji Yokoyama
Experimenter: Dr Nicholas Grant
Experimenter: Dr Tim Niewelt
Experimenter: Ms Anup Yadav
Experimenter: Professor John Murphy
Experimenter: Dr James Lord

DOI: 10.5286/ISIS.E.RB2410172

ISIS Experiment Number: RB2410172

Publisher: STFC ISIS Neutron and Muon Source

Data format: RAW/Nexus
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Data Citation

The recommended format for citing this dataset in a research publication is as:
[author], [date], [title], [publisher], [doi]

For Example:
Dr Sophie Pain et al; (2024): Establishing the limitations of photoexcited muon spin spectroscopy, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB2410172

Data is released under the CC-BY-4.0 license.