ISIS Neutron and Muon Source Data Journal
This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
IROC Technologies / Integrated Circuits SER tests
Abstract: Integrated Circuits will be tested at ChipIr beam line to reproduce errors induced by terrestrial radiation effects from fast neutrons. Radiation effects tests are part of the overall reliability of electronic components used in several market such as automotive, medical or networking.
Principal Investigator: Mr Cyrille BELTRANDO
Local Contact: Dr Maria Kastriotou
Experimenter: Mr Erwin SCHAEFER
Experimenter: Mr Emmanuel Lenoir
Experimenter: Dr Richun FEI
DOI: 10.5286/ISIS.E.RB2200017
ISIS Experiment Number: RB2200017
| Part DOI | Instrument | Public release date | Download Link |
|---|---|---|---|
| 10.5286/ISIS.E.RB2200017-1 | CHIPIR | 12 May 2025 | Download |
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
Select the data format above to find
out more about it.
Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Mr Cyrille BELTRANDO et al; (2022): IROC Technologies / Integrated Circuits SER tests, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB2200017
Data is released under the CC-BY-4.0 license.
