ISIS Neutron and Muon Source Data Journal
This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
Single-event effect measurement on low-cost high-reliability radiation-hard electronic systems
Abstract: Low cost and high reliability are desirable but conflicting demands on electronic systems needed for applications in harsh environments like spacecraft, aircraft and nuclear reactors. This project is developing a low-cost radiation hard "system-on-chip" to meet these requirements, using the open-source RISC-V microcontroller architecture, and these experiments aims to determine whether - and to what extent - nuclear radiation can cause these devices to fail.
Principal Investigator: Dr Simon Platt
Local Contact: Dr Maria Kastriotou
Experimenter: Dr David Cheneler
DOI: 10.5286/ISIS.E.RB2000260
ISIS Experiment Number: RB2000260
| Part DOI | Instrument | Public release date | Download Link |
|---|---|---|---|
| 10.5286/ISIS.E.RB2000260-1 | CHIPIR | 06 June 2024 | Download |
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
Select the data format above to find
out more about it.
Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Dr Simon Platt et al; (2021): Single-event effect measurement on low-cost high-reliability radiation-hard electronic systems, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB2000260
Data is released under the CC-BY-4.0 license.
