ISIS Neutron and Muon Source Data Journal

Reliability of Modern Microelectronics in Space and Terrestrial Radiation Environments

Abstract: The objective of this proposal is to perform a series of Single Event Upsets (SEU) characterisations within space weather environments for modern microelectronics i.e. Commercial Off The Shelf SRAM Memories with feature sizes <90 nm which are analogous to devices found in a wide range of systems. Four different boards have been designed and built for positioning within a radiation source beam. A chosen pattern will be written to the SRAMs and then following irradiation the pattern can be compared to determine the number of SEUs which were experienced. These can be compared with results from other radiation sources and the project outcomes should be able to inform the reliability of the chosen technologies to perform critical functions on large scale systems e.g. mobile phone systems or high value assets e.g. avionics, satellites etc.

Principal Investigator: Dr Keith Ryden
Local Contact: Dr Chris Frost
Experimenter: Mr Matthew Barker

DOI: 10.5286/ISIS.E.RB2020007

ISIS Experiment Number: RB2020007

Publisher: STFC ISIS Neutron and Muon Source

Data format: RAW/Nexus
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Data Citation

The recommended format for citing this dataset in a research publication is as:
[author], [date], [title], [publisher], [doi]

For Example:
Dr Keith Ryden et al; (2020): Reliability of Modern Microelectronics in Space and Terrestrial Radiation Environments, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB2020007

Data is released under the CC-BY-4.0 license.