ISIS Neutron and Muon Source Data Journal
This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
Understanding Radiation-induced Effects in State-of-the-Art Embedded Processors
Abstract: The susceptibility of electronic devices to atmospheric radiation is no longer just of concern to the aerospace industry. At sea level, a 100,000-device deployment can expect to experience a radiation-induced failure once every few hours. System reliability is thus of ever-increasing concern, particularly in safety-critical scenarios including in the automotive and health sectors, wherein the use of performance-demanding machine learning applications is increasingly desired. We wish to increase our knowledge of radiation-induced effects in modern electronic devices, particularly embedded CPUs, and gauge the effectiveness of techniques designed to increase their reliability.
Principal Investigator: Dr James Davis
Local Contact: Dr Carlo Cazzaniga
Experimenter: Mr harvin iriawan
DOI: 10.5286/ISIS.E.RB2000113
ISIS Experiment Number: RB2000113
| Part DOI | Instrument | Public release date | Download Link |
|---|---|---|---|
| 10.5286/ISIS.E.RB2000113-1 | CHIPIR | 16 December 2022 | Download |
| 10.5286/ISIS.E.RB2000113-2 | CHIPIR | 17 February 2023 | Download |
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
Select the data format above to find
out more about it.
Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Dr James Davis et al; (2019): Understanding Radiation-induced Effects in State-of-the-Art Embedded Processors, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB2000113
Data is released under the CC-BY-4.0 license.
