This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
Investigation on the effect of muons on various types of commercial memories
Abstract: Recent memory technologies are becoming more and more sensitive to radiation because of device miniaturisation. Models show that even atmospheric muons are now susceptible to induce data corruption in memories; however, their effect remains largely unexplored and only few experimental studies have been carried out to this day. My reasearch group proposes to use the muon beams available at ISIS to evaluate the behaviour of static RAMs (SRAMs) of different technology nodes, as well as that of FRAM, MRAM and Flash memories under muon irradiation. The results from this study would complement the results obtained with other particle species, and in particular atmospheric-like neutrons with the Vesuvio instrument, on similar devices.
Principal Investigator: Dr Luigi Dilillo
Experimenter: Dr Adrian Hillier
Experimenter: Mr Alexandre Bosser
Experimenter: Mr Viyas Gupta
DOI: 10.5286/ISIS.E.RB1610366
ISIS Experiment Number: RB1610366
Part DOI | Instrument | Public release date | Download Link |
---|---|---|---|
10.5286/ISIS.E.74563194 | CHRONUS | 15 March 2019 | Download |
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
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Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Dr Luigi Dilillo et al; (2016): Investigation on the effect of muons on various types of commercial memories, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1610366
Data is released under the CC-BY-4.0 license.