ISIS Neutron and Muon Source Data Journal

Diffuse scattering from doped zinc oxide

Abstract: Zinc oxide is an important wide band gap semiconductor material used in a diverse range of industrial applications, many of which require both n-type and p-type components. It can easily be doped n-type, but it is difficult to dope p-type. We have measured the structural diffuse scattering and inelastic scattering from as-grown nominally stoichiometric, oxidised and reduced zinc oxide using neutron Laue diffraction on SXD. We now propose to study the defect structures and lattice dynamics of n-type and p-type doped single crystals of zinc oxide. Given our sensitivity to diffuse structural scattering, we expect to shed light on the effect of defect structures on the electrical transport properties. We shall also determine how doping affects the phonon dispersion and thermal transport properties.

Principal Investigator: Professor Jon Goff
Experimenter: Dr Keith Refson
Local Contact: Dr Matthias Gutmann
Experimenter: Mr Tim Lehner
Experimenter: Dr Rob Potter
Experimenter: Dr Dharmalingan Prabhakaran
Experimenter: Mr Chris Nuttall
Experimenter: Dr Uthayakumar Sivaperumal

DOI: 10.5286/ISIS.E.RB1710073

ISIS Experiment Number: RB1710073

Publisher: STFC ISIS Neutron and Muon Source

Data format: RAW/Nexus
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Data Citation

The recommended format for citing this dataset in a research publication is as:
[author], [date], [title], [publisher], [doi]

For Example:
Professor Jon Goff et al; (2017): Diffuse scattering from doped zinc oxide, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1710073

Data is released under the CC-BY-4.0 license.