This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
Neutron tests of 16-nm technology node IC designs
Abstract: This test will be part of commissioning program for ChipIR facility. We plan to use multiple boards with custom designed test ICs to evaluate single-event performance of FF and logic circuits. These ICs have been tested at Los Alamos National Labs in USA using their ICEHouse I facility. The results from tests at ISIS will allow a meaningful comparison between the two facilities. Our objective will be to obtain FIT rates for hardened and non-hardened FF designs.
Principal Investigator: Professor Bharat Bhuva
Experimenter: Mr Richard Wong
Experimenter: Ms Nandita Bhuva
Local Contact: Dr Chris Frost
DOI: 10.5286/ISIS.E.RB1700057
ISIS Experiment Number: RB1700057
Part DOI | Instrument | Public release date | Download Link |
---|---|---|---|
10.5286/ISIS.E.84785409 | CHIPIR | 13 March 2020 | Download |
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
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Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Professor Bharat Bhuva et al; (2017): Neutron tests of 16-nm technology node IC designs, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1700057
Data is released under the CC-BY-4.0 license.