ISIS Neutron and Muon Source Data Journal

Test of Neutron Effects On Commercial Off The Shelf FPGA

Abstract: The goal of these joint ChipIR/VESUVIO proposed experiments is to characterize the SEU occurrence on new generation FPGA caused by neutrons. We will focus on a Commercial Off-The-Shelf (COTS) component, in order to evaluate its robustness and its potential use in space environment in particular for micro and nano satellites. Due to their weight, power and budget limitations, and their low altitude operation, these satellites commonly use high performance COTS components.FPGAs represent a very interesting solution for signal acquisition, processing and transmission in such satellites. In this frame, their susceptibility to neutrons is an fundamental issue. The main purpose of the experiment is to make an accurate diagnosis of what are the faults produced in very high density FPGA. This analysis could lead to the creation of a reliability model of the FPGA.

Principal Investigator: Professor Gian Carlo Cardarilli
Experimenter: Professor Roberto Senesi
Experimenter: Dr Luca Di Nunzio
Experimenter: Dr Pierfrancesco Ulpiani
Experimenter: Professor Carla Andreani
Local Contact: Dr Carlo Cazzaniga

DOI: 10.5286/ISIS.E.RB1900005

ISIS Experiment Number: RB1900005

Publisher: STFC ISIS Neutron and Muon Source

Data format: RAW/Nexus
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Data Citation

The recommended format for citing this dataset in a research publication is as:
[author], [date], [title], [publisher], [doi]

For Example:
Professor Gian Carlo Cardarilli et al; (2018): Test of Neutron Effects On Commercial Off The Shelf FPGA, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1900005

Data is released under the CC-BY-4.0 license.