ISIS Neutron and Muon Source Data Journal

Testing of Latching Current Limiters for Single Event Effects

Abstract: As part of the activities relating to the TRISAT project, we have developed an approach to designing SEE tolerant electronic circuits by using COTS components. The approach consists of the use of basic analogue parts that is then coupled with of a careful component selection in combination with an FPGA circuit, enabling various miniaturized complex circuits to be produced. We have applied this approach in the design of three different kinds of LCLs (Latching Current Limiters), each with a different set of functionalities. By testing the LCLs and the FPGA control circuits for SEE effects, we would like to show that the design approach we used is suitable for producing SEE tolerant electronics. We already performed proton beam tests and have found no occurrences of SEE effects - by performing a similar test with a neutron beam, we would further strengthen the confidence in the design.

Principal Investigator: Dr Iztok Kramberger
Experimenter: Mr David Selcan
Local Contact: Dr Carlo Cazzaniga
Experimenter: Mr Gregor Kirbi?
Experimenter: Mr Dejan Gacnik
Experimenter: Mr Lorenzo Gonzales

DOI: 10.5286/ISIS.E.RB1800103

ISIS Experiment Number: RB1800103

Publisher: STFC ISIS Neutron and Muon Source

Data format: RAW/Nexus
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Data Citation

The recommended format for citing this dataset in a research publication is as:
[author], [date], [title], [publisher], [doi]

For Example:
Dr Iztok Kramberger et al; (2018): Testing of Latching Current Limiters for Single Event Effects, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1800103

Data is released under the CC-BY-4.0 license.