ISIS Neutron and Muon Source Data Journal

Intrinsic defect structures in zinc oxide

Abstract: Zinc oxide is an important semiconductor, but its use in a wide range of applications is limited by the difficulty in doping p-type. This is believed to be related to the nature of the intrinsic defects, which cause a self-compensation of free carriers. We plan to determine the defect structures in nominally stoichiometric zinc oxide using single-crystal diffuse neutron scattering. Our previous measurements indicate that various defects contribute to the diffuse scattering along with the thermal diffuse scattering. We aim to separate the various contributions via their different temperature dependencies. Hence we propose to study single-crystal zinc oxide mounted in a furnace as a function of temperature using neutron Laue diffraction on SXD.

Principal Investigator: Professor Jon Goff
Experimenter: Mr Chris Nuttall
Experimenter: Dr Keith Refson
Local Contact: Dr Matthias Gutmann
Experimenter: Mr Tim Lehner
Experimenter: Dr Rob Potter
Experimenter: Dr Uthayakumar Sivaperumal
Experimenter: Dr Dharmalingan Prabhakaran

DOI: 10.5286/ISIS.E.RB1810173

ISIS Experiment Number: RB1810173

Publisher: STFC ISIS Neutron and Muon Source

Data format: RAW/Nexus
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Data Citation

The recommended format for citing this dataset in a research publication is as:
[author], [date], [title], [publisher], [doi]

For Example:
Professor Jon Goff et al; (2018): Intrinsic defect structures in zinc oxide, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1810173

Data is released under the CC-BY-4.0 license.