ISIS Neutron and Muon Source Data Journal

Test of Neutron Effects On Commercial Off The Shelf Microcontroller

Abstract: The goal of this experiment is to characterize the SEU occurrence on a Microcontroller caused by neutrons. We will focus on a COTS component, in order to evaluate its robustness and its potential use in space environment. The common usage of Commercial Off-The-Shelf components for low-end space applications would permit several improvements in terms of design time and in terms of system's price. The main purpose of the experiment is to make an accurate diagnosis of what are the microcontroller’s resources where the radiation causes faults.This analysis could lead to the creation of a reliability model of the microcontroller and can bring suggestions to the designers about which parts of the device need the most a radiation hardening approach.

Principal Investigator: Professor Marco Ottavi
Experimenter: Dr Alessandra Menicucci
Local Contact: Dr Carlo Cazzaniga
Experimenter: Mr Fabio Malatesta
Experimenter: Professor Carla Andreani
Experimenter: Dr Gianluca Furano
Experimenter: Professor Roberto Senesi
Experimenter: Dr Claudia Scatigno

DOI: 10.5286/ISIS.E.RB1800056

ISIS Experiment Number: RB1800056

Publisher: STFC ISIS Neutron and Muon Source

Data format: RAW/Nexus
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Data Citation

The recommended format for citing this dataset in a research publication is as:
[author], [date], [title], [publisher], [doi]

For Example:
Professor Marco Ottavi et al; (2018): Test of Neutron Effects On Commercial Off The Shelf Microcontroller, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1800056

Data is released under the CC-BY-4.0 license.