This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
Neutron Sensitivity of ARM Computing Architectures for Automotive and High Performance Computing Applications
Abstract: With the experiment at ChipIR we will measured and characterized the Single Event Effects (SEEs) produced by neutrons available at ISIS in different algorithms for automotive and HPC applications executed in three ARM architectures. We will test ARM A-9, A-53, and A-57. In this proposal we intend to compare the radiation-induced error rates of these devices. The goal of this proposal is to continue our evaluation of the resilience of modern parallel devices for automotive applications and to engage ARM with ChipIR. This first step is likely to stimulate ARM to invest in their architectures reliability. During our experiments we will run object-detection frameworks for automotive applications as well as benchmarks for HPC applications, comparing the impact of neutrons in the three selected devices.
Principal Investigator: Dr Paolo Rech
Local Contact: Dr Carlo Cazzaniga
Experimenter: Dr Fernando Fernandes Dos Santos
Experimenter: Mr Pablo Bodmann
Experimenter: Mr Dony Wang
DOI: 10.5286/ISIS.E.RB1900123
ISIS Experiment Number: RB1900123
Part DOI | Instrument | Public release date | Download Link |
---|---|---|---|
10.5286/ISIS.E.101136531 | CHIPIR | 19 February 2022 | Download |
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
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Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Dr Paolo Rech et al; (2019): Neutron Sensitivity of ARM Computing Architectures for Automotive and High Performance Computing Applications, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1900123