This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
ChipIr commercial access: IROC Technologies
Abstract: Integrated Circuits will be tested at ChipIr beam line to reproduce errors induced by terrestrial radiation effects from fast neutrons.Radiation effects tests are part of the overall reliability of electronic components used in several market such as automotive, medical or networking.Objective will also be to continue comparing results with other test facilities such at LANSCE/WNR and TRIUMF/TNF.
Principal Investigator: Mr Cyrille BELTRANDO
Local Contact: Dr Carlo Cazzaniga
Experimenter: Mr Erwin SCHAEFER
Experimenter: Mr A Duong In
DOI: 10.5286/ISIS.E.RB1900119
ISIS Experiment Number: RB1900119
Part DOI | Instrument | Public release date | Download Link |
---|---|---|---|
10.5286/ISIS.E.101133699 | CHIPIR | 22 March 2022 | Download |
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
Select the data format above to find
out more about it.
Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Mr Cyrille BELTRANDO et al; (2019): ChipIr commercial access: IROC Technologies, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1900119
Data is released under the CC-BY-4.0 license.