ISIS Neutron and Muon Source Data Journal
This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
Single- and Multibit Measurements of recent technology nodes
Abstract: Measurements of single-event upsets in recent semiconductor technology nodes.
Principal Investigator: Dr Karsten Ermisch
Experimenter: Dr Rosina Menditto
Local Contact: Dr Carlo Cazzaniga
DOI: 10.5286/ISIS.E.RB1900106
ISIS Experiment Number: RB1900106
| Part DOI | Instrument | Public release date | Download Link |
|---|---|---|---|
| 10.5286/ISIS.E.100689251 | CHIPIR | 28 March 2022 | Download |
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
Select the data format above to find
out more about it.
Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Dr Karsten Ermisch et al; (2019): Single- and Multibit Measurements of recent technology nodes, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB1900106
Data is released under the CC-BY-4.0 license.
