ISIS Neutron and Muon Source Data Journal
This is a page describing data taken during an experiment at the ISIS Neutron and Muon Source. Information about the ISIS Neutron and Muon Source can be found at https://www.isis.stfc.ac.uk.
Understanding Radiation-induced Effects in State-of-the-Art Embedded Processors
Abstract: The susceptibility of electronic devices to atmospheric radiation is no longer just of concern to the aerospace industry. At sea level, a 100,000-device deployment can expect to experience a radiation-induced failure once every few hours. System reliability is thus of ever-increasing concern, particularly in safety-critical scenarios including in the automotive and health sectors, wherein the use of performance-demanding machine learning applications is increasingly desired. We wish to increase our knowledge of radiation-induced effects in modern electronic devices, particularly embedded CPUs, and gauge the effectiveness of techniques designed to increase their reliability.
Public release date: 17 February 2023
Principal Investigator: Dr James Davis
Local Contact: Dr Carlo Cazzaniga
Experimenter: Mr harvin iriawan
DOI: 10.5286/ISIS.E.RB2000113-2
Parent DOI: 10.5286/ISIS.E.RB2000113
ISIS Experiment Number: RB2000113
Part Number: 2
Date of Experiment: 16 February 2020
Publisher: STFC ISIS Neutron and Muon Source
Data format: RAW/Nexus
Select the data format above to find
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Data Citation
The recommended format for citing this dataset in a research
publication is as:
[author], [date], [title], [publisher],
[doi]
For Example:
Dr James Davis et al; (2020): Understanding Radiation-induced Effects in State-of-the-Art Embedded Processors, STFC ISIS Neutron and Muon Source, https://doi.org/10.5286/ISIS.E.RB2000113-2
Data is released under the CC-BY-4.0 license.
